$29
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Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Standard in brief
Scope of Application:
本文件描述了一种用于优化一般分析目的的飞行时间二次离子质谱(SIMS)仪器的质量校准准确度的方法。本文件仅适用于飞行时间仪器,但并不限于任何特定的仪器设计。本文件提供了对一些仪器参数优化的指导,这些参数能使用此程序进行优化,还提供了适用于校准质量标以获得最佳质量准确度的一般峰的类型。
Basic information
Standard No:GB/T 40129-2021
Standard Name:表面化学分析 二次离子质谱 飞行时间二次离子质谱仪质量标校准
English Name:Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Standard Status:现行
Release Date:2021-05-21
Effective Date:2021-12-01
Language of Publication:中文简体
Standard Classification
ICS Number:71.040.40
CCS Number:G04
Related Standards
Adopted Standards:ISO 13084:2018
Adopted Standard Name:《表面化学分析 二次离子质谱 飞行时间二次离子质谱仪质量标校准》
Adoption Level:IDT
Publication Information
Number of pages:20
Number of words:28 K
Format:大16
Edition:1
Color Pages:0
Electronic Version:Yes
Color Images:No
Print Publication Date:2021-05-01
Standard Revision Information
Has Amendment:No
Other Information
Application Dept:国家市场监督管理总局、国家标准化管理委员会
Standard Type:CN
Standard Attribute:GB
Other Standard Number:40129
Drafter:陈建、谢方艳、龚力、杨慕紫、杨皓、张浩、张卫红
Drafting Organization:中山大学
Management Organization:全国微束标准化技术委员会(SAC/TC 38)
Proposing Department:全国微束标准化技术委员会(SAC/TC 38)