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Chinese Standard: GB/T 19247.6-2024

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Printed board assemblies—Part 6:Evaluation criteria for voids in soldered joints of BGA and LGA and measurement method


Standard in brief
Scope of Application:  
本文件规定了印制板组装件在热循环寿命内焊点空洞评估要求,描述了利用X射线观察法测定空洞的方法。本文件适用于印制板上焊接的球栅阵列(BGA)器件和盘栅阵列(LGA)器件焊点产生的空洞评估和测试,不适用于印制板组装前BGA器件封装自身空洞的评估和测试。本文件也适用于除BGA器件和LGA器件外,具有熔化和再凝固形成焊点的空洞评估和测试,如倒装芯片和多芯片组件。不适用于印制板组装件BGA器件和印制板之间有底部填充材料,或器件封装体内焊点的评估和测试。本文件适用于焊点中产生的从10 μm到几百微米的大空洞,不适用于直径小于10 μm的较小空洞(如平面微空洞)。

Basic information
Standard No:GB/T 19247.6-2024
Standard Name:印制板组装 第6部分:球栅阵列(BGA)和盘栅阵列(LGA)焊点空洞的评估要求及测试方法
English Name:Printed board assemblies—Part 6:Evaluation criteria for voids in soldered joints of BGA and LGA and measurement method
Standard Status:现行
Release Date:2024-03-15
Effective Date:2024-07-01
Language of Publication:中文简体

Standard Classification
ICS Number:31.180
CCS Number:L30

Related Standards
Referenced Standards:GB/T 2421-2020,IEC 60194-1:2021,IEC 60194-2:2017
Adopted Standards:IEC 61191-6:2010
Adopted Standard Name:《印制板组装 第6部分:球栅阵列(BGA)和盘栅阵列(LGA)焊点空洞的评估要求及测试方法》
Adoption Level:MOD

Publication Information
Number of pages:36
Number of words:54 K
Format:大16
Edition:1
Color Pages:0
Electronic Version:Yes
Color Images:Yes
Print Publication Date:2024-03-01

Standard Revision Information
Has Amendment:No

Other Information
Application Dept:国家市场监督管理总局、国家标准化管理委员会
Standard Type:CN
Standard Attribute:GB
Other Standard Number:19247.6
Drafter:张晟、张裕、赵文忠、聂延平、姚成文、金星、张飞、刘冰、曹易
Drafting Organization:中国电子科技集团公司第二十研究所、中国电子标准化研究院
Management Organization:全国印制电路标准化技术委员会(SAC/TC 47)
Proposing Department:中华人民共和国工业和信息化部

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