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Examination methods for similarity comparison of integrated circuit chips
Standard in brief
Scope of Application：
本标准规定了集成电路芯片相似性比对检验方法。
本标准适用于集成电路芯片相似性比对，检验集成电路芯片设计的相似性。
Basic information
Standard No：GA/T 1171-2014
Standard Name：芯片相似性比对检验方法
English Name：Examination methods for similarity comparison of integrated circuit chips
Standard Status：现行
Release Date：2014-07-09
Effective Date：2014-07-09
Language of Publication：中文简体
Standard Classification
ICS Number：31.200
CCS Number：L56
Related Standards
Referenced Standards：GA/T 756-2008,GA/T 976-2012
Publication Information
Number of pages：8
Number of words：6 K
Format：大16
Edition：1
Color Pages：0
Electronic Version：Yes
Color Images：No
Print Publication Date：2014-09-01
Standard Revision Information
Has Amendment：No
Other Information
Application Dept：中华人民共和国公安部
Standard Type：QT
Standard Attribute：GA
Other Standard Number：1171
Drafter：沙晶、金波、杭强伟、蔡立明、徐隽
Drafting Organization：公安部第三研究所
Management Organization：公安部信息系统安全标准化技术委员会
Proposing Department：公安部第三研究所
