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Nanotechnologies—Electron microscopy imaging of noble metal nanoparticles—High angle annular dark field imaging method
Standard in brief
Scope of Application：
This standard specifies a method of imaging noble metal nanoparticles using high angle annular dark field imaging technique of electron microscope.
This standard is applicable to imaging of noble metal nanoparticles with single-type of element and noble metal nanoparticles in composite materials.
Basic information
Standard No：GB/T 34831-2017e
Standard Name：纳米技术 贵金属纳米颗粒电子显微镜成像 高角环形暗场法
English Name：Nanotechnologies—Electron microscopy imaging of noble metal nanoparticles—High angle annular dark field imaging method
Standard Status：In force
Release Date： 2017-11-01
Effective Date：2018-05-01
Language of Publication：English
Standard classifiction No
Standard ICS No：17.180.01;37.020
Chinese Standard Classifiction No：N33
Associated Standard
Quoted Standard：GB/T 19619
Publication Information
Number of pages：24
Number of words：28 K
Other Information
Standard Type：CN
Standard Attribute：GBE
Standard No：34831
Technical Committees：SAC/TC 279 National Standardization Technical Committee on Nanotechnology of SAC.
Proposed Unit：Chinese Academy of Sciences(CAS).
Application Dept：General Administration of Quality Supervision,Inspection and Quarantine of the People's Republic of China and Standardization Administration of the People's Republic of China
