Chinese Standard: GB/T 21006-2007

Surface chemical analysis—X-ray photoelectron and Auger electron spectrometers—Linearity of intensity scale

IDT  ISO 21270:2004

全国微束标准化技术委员会

本标准规定了两种方法，用于测定AES和XPS谱仪强度标在容许线性离散限度范围内的最大计数率。它也包括校正强度非线性的方法，以便那些谱仪可使用更高的最大计数率，对于这些谱仪相关的校正公式已被证明是有效的。

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