Chinese Standard: GB/T 23413-2009

Determination of crystallite size and micro-strain of nano-materials—X-ray diffraction line broadening method

全国微束标准化技术委员会

本标准规定了利用X射线衍射线宽化法来测定纳米材料晶粒尺寸和微观应变的方法。本标准采用的计算方法是近似函数法。
本标准适用于测定晶粒尺寸一般不大于100 nm，微观应变一般不大于0.1%的纳米材料。

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