Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of methods used for charge control and charge correction
IDT ISO 19318:2004
全国微束分析标准化技术委员会
本标准以最少量的资料描述了用X射线光电子能谱测量绝缘样品内能级结合能，及将在报告其分析结果时所采用的荷电控制和荷电校正方法，也给出了在结合能测量过程中对于荷电控制和荷电校正有用的方法资料。
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