Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
IDT ISO 16700:2004
全国微束分析标准化技术委员会(SAC/TC 38)
本标准规定了使用适当的参考物质对扫描电镜（SEM）图像的放大倍率进行校准的方法。
本标准限于对由参考物质上线距大小的范围所决定的放大倍率进行校准。
本标准不适用于专用测长型扫描电镜。
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