Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
全国微束分析标准化技术委员会(SAC/TC 38)
本标准规定了使用适当的参考物质对扫描电镜（SEM）图像的放大倍率进行校准的方法。本标准适用于对由校准参考物质上间距大小的可用范围决定的放大倍率进行校准。本标准不适用于专用测长型扫描电镜。
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