Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Methods used to determine peak intensities and information required when reporting results
IDT ISO 20903:2006
全国微束分析标准化技术委员会(SAC/TC 38)
本标准规定了俄歇电子能谱和X射线光电子能谱的峰强度测量的分析结果报告中所要求的必要信息。提供了峰强度测量方法和所得峰面积的不确定度信息。
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