Characterization of semiconducting single-walled carbon nanotubes using near infrared photoluminescence spectroscopy
全国纳米技术标准化技术委员会(SAC/TC 279)
本标准规定了近红外光致发光光谱方法表征半导体性单壁碳纳米管的原理的基础上，规范了使用仪器、制样方法、测量步骤、实验数据处理及结果分析、不确定度影响因素分析和测试报告等内容。
本标准适用于利用近红外光致发光光谱方法表征半导体性单壁碳纳米管手性指数和相对质量浓度。
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