Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
IDT ISO 18118:2004
全国微束分析标准化技术委员会(SAC/TC 38)
本标准规定了在俄歇电子能谱和X射线光电子能谱均匀材料定量分析中相对灵敏度因子的实验测量和使用指南。
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