Chinese Standard: GB/T 30859-2014

Test method for warp and waviness of silicon wafers for solar cells

全国半导体设备和材料标准化技术委员会(SAC/TC 203)、材料分技术委员会(SAC/TC 203/SC 2)

本标准规定了太阳能电池用硅片（以下简称硅片）翘曲度和波纹度的测试方法。
本标准适用于硅片翘曲度和波纹度的测试。

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