Chinese Standard: GB/T 30860-2014

Test methods for surface roughness and saw mark of silicon wafers for solar cells

全国半导体设备和材料标准化技术委员会(SAC/TC 203)、材料分技术委员会(SAC/TC 203/SC 2)

本标准规定了太阳能电池用硅片（以下简称硅片）的表面粗糙度及切割线痕的接触式或非接触式轮廓测试方法。
本标准适用于通过线切工艺加工生产的单晶和多晶硅片。如果需要适用于其他产品，则需相关各方协商同意。

This standard is the original Chinese electronic standard.
After you successfully purchase, we will send the electronic version of this standard to your email address.
If you need translation, please contact email: ChineseStandardsLibraryS001@gmail.com.