Surface chemical analysis—Depth profiling—Measurement of sputtering rate:mesh-replica method using a mechanical stylus profilometer
IDT ISO/TR 22335:2007
全国微束标准化技术委员会(SAC/TC 38)
his standard is the original Chinese electronic standard. After you successfully purchase, we will send the electronic version of this standard to your email address. If you need translation, please contact email: ChineseStandardsLibraryS001@gmail.com.
