$10
Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy(XPS)
IDT ISO 16243:2011
全国微束分析标准化技术委员会(SAC/TC 38)
本标准规定了分析者使用X射线光电子能谱(XPS)分析试样后应报告信息的最低要求。包括原始记录和分析记录的信息。
This standard is the original Chinese electronic standard.
After you successfully purchase, we will send the electronic version of this standard to your email address.
If you need translation, please contact email: ChineseStandardsLibraryS001@gmail.com