Nanotechnology—Test method for size of nanoparticles—Atomic force microscopy
全国纳米技术标准化技术委员会(SAC/TC 279)
本标准规定了用原子力显微术(Atomic force microscopy，简称AFM)测量纳米颗粒高度来表征纳米颗粒尺寸的方法。
本标准适用于分散在平整衬底表面上的纳米颗粒测量。
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