Chinese Standard: GB/T 35003-2018

Test methods for endurance and data retention of non-volatile memory

全国半导体器件标准化技术委员会(SAC/TC 78)

本标准规定了非易失性存储器耐久和数据保持试验的方法。

本标准适用于电可擦除可编程只读存储器(EEPROM)、快闪存储器(Flash)以及内嵌上述存储器的集成电路(以下简称器件)。

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