Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry
全国半导体器件标准化技术委员会(SAC/TC 78)
本标准规定了半导体集成电路 低电压差分信号（LVDS，low voltage differential signaling）电路（以下称为“器件”）静态参数、动态参数测试方法的基本原理。
本标准适用于低电压差分信号电路静态参数、动态参数的测试。
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