Test method for boron content in polycrystalline silicon by vacuum zone-melting method
全国半导体设备和材料标准化技术委员会(SAC/TC 203)、全国半导体设备和材料标准化技术委员会材料分会(SAC/TC 203/SC 2)
本标准规定了多晶硅中基硼含量的测试方法。
本标准适用于在硅芯上沉积生长的多晶硅棒中基硼含量的测定。基硼含量（原子数）测定范围为0.01×1013 cm－3～5×1015 cm－3。
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