Chinese Standard: GB/T 4937.1-2006

Semiconductor devices—Mechanical and climatic test methods—Part 1:General

IDT  IEC 60749-1:2002

全国半导体器件标准化技术委员会

本部分适用于半导体器件（分立器件和集成电路）并为GB/T 4937系列的其他部分建立通用准则。
当本部分与相应的详细规范有矛盾时，以详细规范为准。

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