Test methods for properties of structure ceramic used in electronic components and device—Part 8:Test method for microstructure
中国电子技术标准化研究院
GB/T 5594的本部分规定了氧化铝瓷、氧化铍瓷、滑石瓷和镁橄榄石瓷等电子元器件结构陶瓷显微结构的测定方法。
本部分适用于氧化铝瓷、氧化铍瓷、滑石瓷和镁橄榄石瓷等电子元器件结构陶瓷显微结构的测定。
本部分只涉及光学显微镜的测定内容和测定方法。
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