Surface chemical analysis—X-ray photoelectron spectroscopy—Procedures for determining backgrounds
IDT ISO/TR 18392:2005
全国微束分析标准化技术委员会(SAC/TC 38)
本指导性技术文件给出了确定X射线光电子能谱中本底的指南。
本指导性技术文件适用于固体表面X射线激发的光电子和俄歇电子能谱的本底确定。
This standard is the original Chinese electronic standard. After you successfully purchase, we will send the electronic version of this standard to your email address. If you need translation, please contact email: ChineseStandardsLibraryS001@gmail.com
