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Chinese Standard: GB/T 45713.4-2025

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Electronics assembly technology—Part 4:Endurance test methods for solder joint of area array type package surface mount devices


Standard in brief
Scope of Application:  
本文件规定了安装于印制板上的阵列型封装器件焊点的耐久性试验方法,以评估焊点对热机械应力的耐久性。
本文件适用于工业和消费领域的电子、电气设备中安装于印制板上的阵列型封装器件(FBGA、BGA、FLGA和LGA)和无引脚型封装器件(SON、QFN)焊点耐久性的评估和试验,不适用于对半导体器件自身性能的评估和试验。

Basic information
Standard No:GB/T 45713.4-2025
Standard Name:电子装联技术 第4部分:阵列型封装表面安装器件焊点的耐久性试验方法
English Name:Electronics assembly technology—Part 4:Endurance test methods for solder joint of area array type package surface mount devices
Standard Status:现行
Release Date:2025-05-30
Effective Date:2025-09-01
Language of Publication:中文简体

Standard Classification
ICS Number:31.180
CCS Number:L30

Related Standards
Referenced Standards:GB/T 2423.22,IEC 60191-6-2,IEC 60191-6-5,IEC 61190-1-3,IEC 61249-2-7,IEC 61249-2-8,IEC 62137-3:2011
Adopted Standards:IEC 62137-4:2014
Adopted Standard Name:《电子装联技术 第4部分:阵列型封装表面安装器件焊点的耐久性试验方法》
Adoption Level:MOD

Publication Information
Number of pages:40
Number of words:57 K
Format:大16
Edition:1
Color Pages:0
Electronic Version:Yes
Color Images:No
Print Publication Date:2025-05-01

Standard Revision Information
Has Amendment:No

Other Information
Application Dept:国家市场监督管理总局、国家标准化管理委员会
Standard Type:CN
Standard Attribute:GB
Other Standard Number:45713.4
Drafter:金大元、谢鑫、曹易、叶伟、张乃红、万云、何敏仙、王承山、乔国军、吴陈军、柴光辉、薛超
Drafting Organization:中国电子科技集团公司第三十六研究所、中国电子技术标准化研究院、航天科工集团第三研究院第八三五八研究所、中认南信(江苏)检测技术有限公司
Management Organization:全国印制电路标准化技术委员会(SAC/TC 47)
Proposing Department:中华人民共和国工业和信息化部

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